The article 'IC Failure Analysis: Magic, Mystery, and Science' was published in IEEE Design & Test, Volume 14, Issue 3.
Sources
- IC Failure Analysis: Magic, Mystery, and Science - ACM Digital Library (dl.acm.org)
- https://www.computer.org/csdl/magazine/dt/1997/03/d3059/13rRUxcKzSr (computer.org)
- https://ieeexplore.ieee.org/document/605998/ (ieeexplore.ieee.org)